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| Date : 2009/04/16, Hit : 1215 |
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| 제목 |
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세미나공지: Surface/Interface Nano-mechanics Using Atomic Force Microscopy |
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| 작성자 |
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S.H.Cho |
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| 화일 |
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아래와 같이 세미나를 개최합니다. 관심 있는 분들의 참석 부탁드림니다.
세미나명: Surface/Interface Nano-mechanics Using Atomic Force Microscopy
연사명: 김두인 교수 (부산대)
일시: 4월17일(금) 17:00-18:00
장소: 연구6동 1층 세미나실
초록:
The invention of Atomic Force Microscope (AFM) eliminated the use of optical lenses and replaced conventional optical microscopes with a new class of microscopes called the Scanning Probe Microscopes (SPM). Because of their unique characteristics such as high resolution in force metrology, higher resolution and acquisition of nano-scale images, they have found wide applications in a variety of scientific disciplines such as biology, material science, and electrochemistry. The AFM has evolved as a tool of nano-manipulation and nano-fabrication. It operates in two modes: contact mode and non-contact (tapping) mode, which provide additional information such as friction and the mechanical properties. Combining with force spectroscopy in AFM providing more detail information with high spatial resolution, AFM force metrology can reveal unprecedented information for the nanotechnology.
In this talk, the principles of AFM with a couple of experimental results on surface/interface nano-mechanics will be briefly introduced and discussed to demonstrate AFM as a powerful tool for various applications.
문의: 조성학(7077)
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